MSI MS-9652 Manual de usuario

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:service@quiete

Report No： 094061R-ITCEP07V06 Page: 7 of 123 1. General Information 1.1. EUT Description Product Name Notebook Trade Name MSI Model No. MS-168

Report No： 094061R-ITCEP07V06 Page: 97 of 123 10.7. Test Photograph Test Mode : Mode 1 Description : EFT/B Test Setup Test Mode : Mode 1

Report No： 094061R-ITCEP07V06 Page: 98 of 123 Test Mode : Mode 2 Description : EFT/B Test Setup Test Mode : Mode 2 Description : EFT/B

Report No： 094061R-ITCEP07V06 Page: 99 of 123 11. Surge 11.1. Test Specification According to Standard : IEC 61000-4-5 11.2. Test Setup 11.

Report No： 094061R-ITCEP07V06 Page: 100 of 123 11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal gr

Report No： 094061R-ITCEP07V06 Page: 101 of 123 11.6. Test Result Product Notebook Test Item Surge Test Mode Mode 1 Date of Test 2009/04/02

Report No： 094061R-ITCEP07V06 Page: 102 of 123 Product Notebook Test Item Surge Test Mode Mode 2 Date of Test 2009/04/02 Test Site No.2 Shi

Report No： 094061R-ITCEP07V06 Page: 103 of 123 11.7. Test Photograph Test Mode : Mode 1 Description : SURGE Test Setup Test Mode : Mode

Report No： 094061R-ITCEP07V06 Page: 104 of 123 12. Conducted Susceptibility 12.1. Test Specification According to Standard : IEC 61000-4-6 12.2

Report No： 094061R-ITCEP07V06 Page: 105 of 123 12.3. Limit Item Environmental Phenomena Units Tes t Specification Performance Criteria Signal P

Report No： 094061R-ITCEP07V06 Page: 106 of 123 12.6. Test Result Product Notebook Test Item Conducted susceptibility Test Mode Mode 1 Date of

Report No： 094061R-ITCEP07V06 Page: 8 of 123 Keyparts List Item Vendor Model name M/B MSI MS-1682 P8600, 2.4GHz P8400, 2.26GHz P7350, 2.0GHz T59

Report No： 094061R-ITCEP07V06 Page: 107 of 123 Product Notebook Test Item Conducted susceptibility Test Mode Mode 2 Date of Test 2009/04/02

Report No： 094061R-ITCEP07V06 Page: 108 of 123 12.7. Test Photograph Test Mode : Mode 1 Description : Conducted Susceptibility Test Setup T

Report No： 094061R-ITCEP07V06 Page: 109 of 123 Test Mode : Mode 2 Description : Conducted Susceptibility Test Setup Test Mode : Mode 2 De

Report No： 094061R-ITCEP07V06 Page: 110 of 123 13. Power Frequency Magnetic Field 13.1. Test Specification According to Standard : IEC 61000-4-8

Report No： 094061R-ITCEP07V06 Page: 111 of 123 13.6. Test Result Product Notebook Test Item Power frequency magnetic field Test Mode Mode 1 D

Report No： 094061R-ITCEP07V06 Page: 112 of 123 Product Notebook Test Item Power frequency magnetic field Test Mode Mode 2 Date of Test 2009/

Report No： 094061R-ITCEP07V06 Page: 113 of 123 13.7. Test Photograph Test Mode : Mode 1 Description : Power Frequency Magnetic Field Test Se

Report No： 094061R-ITCEP07V06 Page: 114 of 123 14. Voltage Dips and Interruption 14.1. Test Specification According to Standard : IEC 61000-4-11

Report No： 094061R-ITCEP07V06 Page: 115 of 123 14.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal g

Report No： 094061R-ITCEP07V06 Page: 116 of 123 14.6. Test Result Product Notebook Test Item Voltage dips and interruption Test Mode Mode 1 Da

Report No： 094061R-ITCEP07V06 Page: 9 of 123 Note: The EUT is including three models, The MS-1682 for MSI and the CX600, CX600X PRO for different

Report No： 094061R-ITCEP07V06 Page: 117 of 123 Product Notebook Test Item Voltage dips and interruption Test Mode Mode 2 Date of Test 2009/04

Report No： 094061R-ITCEP07V06 Page: 118 of 123 14.7. Test Photograph Test Mode : Mode 1 Description : Voltage Dips Test Setup Test Mode

Report No： 094061R-ITCEP07V06 Page: 119 of 123 15. Attachment  EUT Photograph (1) EUT Photo (2) EUT Photo

Report No： 094061R-ITCEP07V06 Page: 120 of 123 (3) EUT Photo (4) EUT Photo

Report No： 094061R-ITCEP07V06 Page: 121 of 123 (5) EUT Photo (6) EUT Photo

Report No： 094061R-ITCEP07V06 Page: 122 of 123 (7) EUT Photo (8) EUT Photo

Report No： 094061R-ITCEP07V06 Page: 123 of 123 (9) EUT Photo (10) EUT Photo

Report No： 094061R-ITCEP07V06 Page: 10 of 123 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All

Report No： 094061R-ITCEP07V06 Page: 11 of 123 ITEM MODE 3 LCD+CRT 1366*768/60Hz MODE 4 LCD+CRT 1366*768/60Hz CPU INTEL, P8400, 2.26GHz INTEL, P8

Report No： 094061R-ITCEP07V06 Page: 12 of 123 ITEM MODE 7 LCD+CRT 1366*768/60Hz MODE 8 LCD+CRT 1366*768/60Hz CPU INTEL, T5900, 2.2GHz INTEL, T5900

Report No： 094061R-ITCEP07V06 Page: 13 of 123 ITEM MODE 11 LCD+CRT 1366*768/60Hz MODE 12 LCD+CRT 1366*768/60Hz CPU INTEL, T3400, 2.16GHz INTEL, T3

Report No： 094061R-ITCEP07V06 Page: 14 of 123 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the

Report No： 094061R-ITCEP07V06 Page: 15 of 123 1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description

Report No： 094061R-ITCEP07V06 Page: 16 of 123 1.5. EUT Exercise Software 1 Setup the EUT and peripheral as shown on Figure 2 Connect the power to

Test Report Product Name ： Notebook Model No. ： MS-1682, CX600, CX600X ("X"=0~9 or A~Z) Applicant ： MICRO-STAR INT’L Co.,

Report No： 094061R-ITCEP07V06 Page: 17 of 123 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviatio

Report No： 094061R-ITCEP07V06 Page: 18 of 123 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No

Report No： 094061R-ITCEP07V06 Page: 19 of 123 Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulato

Report No： 094061R-ITCEP07V06 Page: 20 of 123 Voltage dips and interruption / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaff

Report No： 094061R-ITCEP07V06 Page: 21 of 123 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26

Report No： 094061R-ITCEP07V06 Page: 22 of 123 Conducted susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IE

Report No： 094061R-ITCEP07V06 Page: 23 of 123 2.4. Test Environment Performed Item Items Required Actual Temperature (C) 15-35 25 Conducted

Report No： 094061R-ITCEP07V06 Page: 24 of 123 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN 5502

Report No： 094061R-ITCEP07V06 Page: 25 of 123 3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance

Report No： 094061R-ITCEP07V06 Page: 26 of 123 3.6. Test Result Site : SR-1 Time : 2009/03/31 - 23:20 Limit : CISPR_B_00M_QP Margin : 10 EUT : No

Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Appr

Report No： 094061R-ITCEP07V06 Page: 27 of 123 Site : SR-1 Time : 2009/03/31 - 23:21 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : EN

Report No： 094061R-ITCEP07V06 Page: 28 of 123 Site : SR-1 Time : 2009/03/31 - 23:21 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : EN

Report No： 094061R-ITCEP07V06 Page: 29 of 123 Site : SR-1 Time : 2009/03/31 - 23:22 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : E

Report No： 094061R-ITCEP07V06 Page: 30 of 123 Site : SR-1 Time : 2009/03/31 - 23:23 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : EN

Report No： 094061R-ITCEP07V06 Page: 31 of 123 Site : SR-1 Time : 2009/03/31 - 23:23 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : EN

Report No： 094061R-ITCEP07V06 Page: 32 of 123 Site : SR-1 Time : 2009/04/01 - 00:40 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : E

Report No： 094061R-ITCEP07V06 Page: 33 of 123 Site : SR-1 Time : 2009/04/01 - 00:41 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : EN

Report No： 094061R-ITCEP07V06 Page: 34 of 123 Site : SR-1 Time : 2009/04/01 - 00:41 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : EN

Report No： 094061R-ITCEP07V06 Page: 35 of 123 Site : SR-1 Time : 2009/04/01 - 00:41 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : E

Report No： 094061R-ITCEP07V06 Page: 36 of 123 Site : SR-1 Time : 2009/04/01 - 00:42 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : EN

QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601

Report No： 094061R-ITCEP07V06 Page: 37 of 123 Site : SR-1 Time : 2009/04/01 - 00:42 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : EN

Report No： 094061R-ITCEP07V06 Page: 38 of 123 3.7. Test Photograph Test Mode : Mode 1 Description : Front View of Conducted Test Test Mode

Report No： 094061R-ITCEP07V06 Page: 39 of 123 Test Mode : Mode 2 Description : Front View of Conducted Test Test Mode : Mode 2 Descriptio

Report No： 094061R-ITCEP07V06 Page: 40 of 123 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard

Report No： 094061R-ITCEP07V06 Page: 41 of 123 4.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the L

Report No： 094061R-ITCEP07V06 Page: 42 of 123 4.6. Test Result Site : SR-1 Time : 2009/04/01 - 00:08 Limit : ISN_Voltage_B_00M_QP Margin : 10 EU

Report No： 094061R-ITCEP07V06 Page: 43 of 123 Site : SR-1 Time : 2009/04/01 - 00:12 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 44 of 123 Site : SR-1 Time : 2009/04/01 - 00:12 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 45 of 123 Site : SR-1 Time : 2009/03/31 - 23:43 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 094061R-ITCEP07V06 Page: 46 of 123 Site : SR-1 Time : 2009/03/31 - 23:46 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 2 of 123 Test Report Certification Issued Date : 2009/04/08 Report No. : 094061R-ITCEP

Report No： 094061R-ITCEP07V06 Page: 47 of 123 Site : SR-1 Time : 2009/03/31 - 23:46 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 48 of 123 Site : SR-1 Time : 2009/04/01 - 00:04 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 094061R-ITCEP07V06 Page: 49 of 123 Site : SR-1 Time : 2009/04/01 - 00:05 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 50 of 123 Site : SR-1 Time : 2009/04/01 - 00:05 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 51 of 123 Site : SR-1 Time : 2009/04/01 - 00:48 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 094061R-ITCEP07V06 Page: 52 of 123 Site : SR-1 Time : 2009/04/01 - 00:50 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 53 of 123 Site : SR-1 Time : 2009/04/01 - 00:50 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 54 of 123 Site : SR-1 Time : 2009/04/01 - 00:44 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 094061R-ITCEP07V06 Page: 55 of 123 Site : SR-1 Time : 2009/04/01 - 00:44 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 56 of 123 Site : SR-1 Time : 2009/04/01 - 00:44 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 3 of 123 Laboratory Information We , QuieTek Corporation, are an independent EMC and safety consultancy that w

Report No： 094061R-ITCEP07V06 Page: 57 of 123 Site : SR-1 Time : 2009/04/01 - 00:52 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 094061R-ITCEP07V06 Page: 58 of 123 Site : SR-1 Time : 2009/04/01 - 00:52 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 59 of 123 Site : SR-1 Time : 2009/04/01 - 00:52 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 094061R-ITCEP07V06 Page: 60 of 123 4.7. Test Photograph Test Mode : Mode 1 Description : Front View of ISN Test Test Mode : Mo

Report No： 094061R-ITCEP07V06 Page: 61 of 123 Test Mode : Mode 2 Description : Front View of ISN Test Test Mode : Mode 2 Description :

Report No： 094061R-ITCEP07V06 Page: 62 of 123 5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN 55022 5.2. Test Setu

Report No： 094061R-ITCEP07V06 Page: 63 of 123 5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above g

Report No： 094061R-ITCEP07V06 Page: 64 of 123 5.6. Test Result Site : OATS-1 Time : 2009/03/27 - 14:59 Limit : CISPR_B_10M_QP Margin : 6 EUT : N

Report No： 094061R-ITCEP07V06 Page: 65 of 123 Site : OATS-1 Time : 2009/03/27 - 14:17 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe :

Report No： 094061R-ITCEP07V06 Page: 66 of 123 Site : OATS-1 Time : 2009/04/01 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CB

Report No： 094061R-ITCEP07V06 Page: 4 of 123 TABLE OF CONTENTS Description Page 1.

Report No： 094061R-ITCEP07V06 Page: 67 of 123 Site : OATS-1 Time : 2009/04/01 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CB

Report No： 094061R-ITCEP07V06 Page: 68 of 123 5.7. Test Photograph Test Mode : Mode 1 Description : Front View of Radiated Test Test Mode

Report No： 094061R-ITCEP07V06 Page: 69 of 123 Test Mode : Mode 2 Description : Front View of Radiated Test Test Mode : Mode 2 Description

Report No： 094061R-ITCEP07V06 Page: 70 of 123 6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN 61000-3-2 6.2

Report No： 094061R-ITCEP07V06 Page: 71 of 123 (b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current s

Report No： 094061R-ITCEP07V06 Page: 72 of 123 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the

Report No： 094061R-ITCEP07V06 Page: 73 of 123 6.6. Test Result Product Notebook Test Item Power Harmonics Test Mode Mode 1 Date of Test 2009/

Report No： 094061R-ITCEP07V06 Page: 74 of 123 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 PO

Report No： 094061R-ITCEP07V06 Page: 75 of 123 Product Notebook Test Item Power Harmonics Test Mode Mode 2 Date of Test 2009/04/03 Test Site

Report No： 094061R-ITCEP07V06 Page: 76 of 123 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 PO

Report No： 094061R-ITCEP07V06 Page: 5 of 123 6.1. Test Specification...

Report No： 094061R-ITCEP07V06 Page: 77 of 123 6.7. Test Photograph Test Mode : Mode 1 Description : Power Harmonics Test Setup Test Mode

Report No： 094061R-ITCEP07V06 Page: 78 of 123 7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN 61000-3-

Report No： 094061R-ITCEP07V06 Page: 79 of 123 c) 7 ％ for equipment which is: － attended whilst in use (for example: hair dryers, vacuum cleaners,

Report No： 094061R-ITCEP07V06 Page: 80 of 123 7.6. Test Result Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 1 Dat

Report No： 094061R-ITCEP07V06 Page: 81 of 123 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 2 Date of Test 2009/0

Report No： 094061R-ITCEP07V06 Page: 82 of 123 7.7. Test Photograph Test Mode : Mode 1 Description : Flicker Test Setup Test Mode : Mode 2

Report No： 094061R-ITCEP07V06 Page: 83 of 123 8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC 61000-4-2 8.2. Test

Report No： 094061R-ITCEP07V06 Page: 84 of 123 8.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only

Report No： 094061R-ITCEP07V06 Page: 85 of 123 8.6. Test Result Product Notebook Test Item Electrostatic Discharge Test Mode Mode 1 Date of Tes

Report No： 094061R-ITCEP07V06 Page: 86 of 123 Product Notebook Test Item Electrostatic Discharge Test Mode Mode 2 Date of Test 2009/04/03 Te

Report No： 094061R-ITCEP07V06 Page: 6 of 123 10.7. Test Photograph ...

Report No： 094061R-ITCEP07V06 Page: 87 of 123 8.7. Test Photograph Test Mode : Mode 1 Description : ESD Test Setup Test Mode : Mode 2 Descr

Report No： 094061R-ITCEP07V06 Page: 88 of 123 9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC 61000-4-3 9.2. Test

Report No： 094061R-ITCEP07V06 Page: 89 of 123 9.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, ar

Report No： 094061R-ITCEP07V06 Page: 90 of 123 9.6. Test Result Product Notebook Test Item Radiated susceptibility Test Mode Mode 1 Date of Tes

Report No： 094061R-ITCEP07V06 Page: 91 of 123 Product Notebook Test Item Radiated susceptibility Test Mode Mode 2 Date of Test 2009/04/03 T

Report No： 094061R-ITCEP07V06 Page: 92 of 123 9.7. Test Photograph Test Mode : Mode 1 Description : Radiated Susceptibility Test Setup Test

Report No： 094061R-ITCEP07V06 Page: 93 of 123 10. Electrical Fast Transient/Burst 10.1. Test Specification According to Standard : IEC 61000-4-4

Report No： 094061R-ITCEP07V06 Page: 94 of 123 10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plan

Report No： 094061R-ITCEP07V06 Page: 95 of 123 10.6. Test Result Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 1 D

Report No： 094061R-ITCEP07V06 Page: 96 of 123 Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 2 Date of Test 2009/